Abstract:
This keynote is a tribute to the late Prof. Mel Breuer, entitled Contributions to CAD and Test. It is organized by Sandeep Gupta. A panel of three prominent speakers give...Show MoreMetadata
Abstract:
This keynote is a tribute to the late Prof. Mel Breuer, entitled Contributions to CAD and Test. It is organized by Sandeep Gupta. A panel of three prominent speakers gives this keynote. The three speakers are Miron Abramovici, Magdy Abadir and Sridhar Narayanan.
Published in: 2017 IEEE 35th VLSI Test Symposium (VTS)
Date of Conference: 09-12 April 2017
Date Added to IEEE Xplore: 18 May 2017
ISBN Information:
Electronic ISSN: 2375-1053