Abstract:
In this IP session, there will be 2 presentations focusing on how to increase the in-field quality level of A/MS devices. The 1st presentation will discuss how to increas...Show MoreMetadata
Abstract:
In this IP session, there will be 2 presentations focusing on how to increase the in-field quality level of A/MS devices. The 1st presentation will discuss how to increase the observed return rates of Automotive ICs to 10ppb but at the same time as removing the costly burn in stage.
Published in: 2019 IEEE 37th VLSI Test Symposium (VTS)
Date of Conference: 23-25 April 2019
Date Added to IEEE Xplore: 11 July 2019
ISBN Information:
Contents 