This paper presents the results of a wideband channel measurement campaign carried out in an indoor environment with representative inventory of a factory. The measurements were carried out using a frequency domain channel sounder from 3.4 - 3.8 GHz and the virtual array method was adopted for averaging small-scale fading effects. From the average power delay profile (APDP), parameters for the Saleh-Valenzuela (S-V) model were extracted for line-of-sight (LoS) and non line-of-sight (NLoS) sites. The ray decay from the S-V model increased with cluster delay for all LoS sites and the delay spread for NLoS sites were higher than LoS locations. The NLoS delay spread was also higher than the results obtained at 2.4 GHz for the same measurement locations. The APDPs from both LoS and NLoS sites showed clustering effects with a mean cluster number of 8/7 for LoS/NLoS sites.