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Exposing digital forgeries from 3-D lighting environments | IEEE Conference Publication | IEEE Xplore

Exposing digital forgeries from 3-D lighting environments


Abstract:

When creating a photographic composite, it can be difficult to match lighting conditions. We describe a technique for measuring lighting conditions in an image, and descr...Show More

Abstract:

When creating a photographic composite, it can be difficult to match lighting conditions. We describe a technique for measuring lighting conditions in an image, and describe its use in detecting photographic composites. Specifically, we describe how to approximate a 3-D lighting environment with a low-dimensional model and how to estimate the model's parameters from a single image. Inconsistencies in the lighting model are then used as evidence of tampering.
Date of Conference: 12-15 December 2010
Date Added to IEEE Xplore: 10 February 2011
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Conference Location: Seattle, WA, USA

References

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