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A novel metric for quantitatively measuring memory effects in OOFDM system | IEEE Conference Publication | IEEE Xplore

A novel metric for quantitatively measuring memory effects in OOFDM system


Abstract:

We propose a novel metric to measure memory effects in optical orthogonal frequency-division multiplexing (OOFDM) system. Experiment results indicate the effectiveness of...Show More

Abstract:

We propose a novel metric to measure memory effects in optical orthogonal frequency-division multiplexing (OOFDM) system. Experiment results indicate the effectiveness of this method by comparing number of error bits at each subcarriers in different memory-depth predistorted scheme.
Date of Conference: 16-18 May 2013
Date Added to IEEE Xplore: 02 December 2013
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Conference Location: Chongqing, China

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