Real-time line scan extraction from infrared images using the wedge method in industrial environments

Rubén Usamentiaga; Julio Molleda; Daniel F. Garcia; Luis Perez; Guillermo Vecino

doi:10.1117/1.3514741

1 October 2010 Real-time line scan extraction from infrared images using the wedge method in industrial environments

Rubén Usamentiaga, Julio Molleda, Daniel F. Garcia, Luis Perez, Guillermo Vecino

Author Affiliations +

Journal of Electronic Imaging, Vol. 19, Issue 4, 043017 (October 2010). https://doi.org/10.1117/1.3514741

Abstract

Infrared imaging is based on the measurement of radiation of an object and its conversion to temperature. A vital parameter of the conversion procedure is emissivity, which defines the capability of a material to absorb and radiate energy. For most applications, emissivity is assumed to be constant. In applications measuring the temperature of objects with high emissivity, this is not problematic, as slight variations in the chosen emissivity value cause only minor changes in the resulting surface temperatures. However, when emissivities are low, as in steel strips, considering emissivity as a constant can lead to significant errors in temperature measurement. To overcome problems generated by variations in emissivity, one solution is to measure temperature where the steel strip forms a wedge, acting as a cavity. In the deepest part of the wedge, emissivity is sufficiently close to one. This work presents a real time image processing system to acquire infrared line scans for steel strips using the wedge method. The proposed system confronts two challenges: extracting infrared line scans in real time from the deepest part of the wedge in rectangular infrared images, and translating pixels from the line scan into real-world units.

©(2010) Society of Photo-Optical Instrumentation Engineers (SPIE)

Citation Download Citation

Rubén Usamentiaga, Julio Molleda, Daniel F. Garcia, Luis Perez, and Guillermo Vecino "Real-time line scan extraction from infrared images using the wedge method in industrial environments," Journal of Electronic Imaging 19(4), 043017 (1 October 2010). https://doi.org/10.1117/1.3514741

Published: 1 October 2010

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available