New method for ellipse detection by means of symmetry

Peng-Yeng Yin; Ling-Hwei Chen

doi:10.1117/12.163973

1 January 1994 New method for ellipse detection by means of symmetry

Peng-Yeng Yin, Ling-Hwei Chen

Author Affiliations +

Journal of Electronic Imaging, Vol. 3, Issue 1, (January 1994). https://doi.org/10.1117/12.163973

Abstract

We propose a new approach for detecting ellipses. The approach is based on the geometrical property that five points on an ellipse can determine the parameters of the ellipse, and the symmetry of ellipses is used to obtain these points. Using symmetry, we classify the edge points in an input image into several subimages. Ellipses with different symmetric axes will lie in different subimages. In each subimage, symmetry is applied again to obtain those sets of five points that possibly lie on the same ellipse. Finally, using geometrical properties and the Hough transform, we extract all ellipses in an input image successfully. The proposed method can detect partially occluded ellipses. Experimental results show that the proposed method is fast and robust.

Citation Download Citation

Peng-Yeng Yin and Ling-Hwei Chen "New method for ellipse detection by means of symmetry," Journal of Electronic Imaging 3(1), (1 January 1994). https://doi.org/10.1117/12.163973

Published: 1 January 1994

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available