Paper
13 April 2018 Triadic split-merge sampler
Anne C. van Rossum, Hai Xiang Lin, Johan Dubbeldam, H. Jaap van der Herik
Author Affiliations +
Proceedings Volume 10696, Tenth International Conference on Machine Vision (ICMV 2017); 1069623 (2018) https://doi.org/10.1117/12.2309466
Event: Tenth International Conference on Machine Vision, 2017, Vienna, Austria
Abstract
In machine vision typical heuristic methods to extract parameterized objects out of raw data points are the Hough transform and RANSAC. Bayesian models carry the promise to optimally extract such parameterized objects given a correct definition of the model and the type of noise at hand. A category of solvers for Bayesian models are Markov chain Monte Carlo methods. Naive implementations of MCMC methods suffer from slow convergence in machine vision due to the complexity of the parameter space. Towards this blocked Gibbs and split-merge samplers have been developed that assign multiple data points to clusters at once. In this paper we introduce a new split-merge sampler, the triadic split-merge sampler, that perform steps between two and three randomly chosen clusters. This has two advantages. First, it reduces the asymmetry between the split and merge steps. Second, it is able to propose a new cluster that is composed out of data points from two different clusters. Both advantages speed up convergence which we demonstrate on a line extraction problem. We show that the triadic split-merge sampler outperforms the conventional split-merge sampler. Although this new MCMC sampler is demonstrated in this machine vision context, its application extend to the very general domain of statistical inference.
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Anne C. van Rossum, Hai Xiang Lin, Johan Dubbeldam, and H. Jaap van der Herik "Triadic split-merge sampler", Proc. SPIE 10696, Tenth International Conference on Machine Vision (ICMV 2017), 1069623 (13 April 2018); https://doi.org/10.1117/12.2309466
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KEYWORDS
Machine vision

Statistical analysis

Computer vision technology

Visualization

Control systems

Data modeling

Statistical inference

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