Steganalysis feature improvement using expectation maximization

Benjamin M. Rodriguez; Gilbert L. Peterson; Sos S. Agaian

doi:10.1117/12.720794

30 April 2007 Steganalysis feature improvement using expectation maximization

Benjamin M. Rodriguez, Gilbert L. Peterson, Sos S. Agaian

Proceedings Volume 6575, Visual Information Processing XVI; 657506 (2007) https://doi.org/10.1117/12.720794
Event: Defense and Security Symposium, 2007, Orlando, Florida, United States

Abstract

Images and data files provide an excellent opportunity for concealing illegal or clandestine material. Currently, there are over 250 different tools which embed data into an image without causing noticeable changes to the image. From a forensics perspective, when a system is confiscated or an image of a system is generated the investigator needs a tool that can scan and accurately identify files suspected of containing malicious information. The identification process is termed the steganalysis problem which focuses on both blind identification, in which only normal images are available for training, and multi-class identification, in which both the clean and stego images at several embedding rates are available for training. In this paper an investigation of a clustering and classification technique (Expectation Maximization with mixture models) is used to determine if a digital image contains hidden information. The steganalysis problem is for both anomaly detection and multi-class detection. The various clusters represent clean images and stego images with between 1% and 10% embedding percentage. Based on the results it is concluded that the EM classification technique is highly suitable for both blind detection and the multi-class problem.

Citation Download Citation

Benjamin M. Rodriguez, Gilbert L. Peterson, and Sos S. Agaian "Steganalysis feature improvement using expectation maximization", Proc. SPIE 6575, Visual Information Processing XVI, 657506 (30 April 2007); https://doi.org/10.1117/12.720794

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