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Generating decision regions in analog measurement spaces

Published:17 April 2005Publication History

ABSTRACT

We develop a neural network that learns to separate the nominal from the faulty instances of a circuit in a measurement space. We demonstrate that the required separation boundaries are, in general, non-linear. Unlike previous solutions which draw hyperplanes, our network is capable of drawing the necessary non-linear hypersurfaces. The hypersurfaces translate to test criteria that are strongly correlated to functional tests. A feature selection algorithm interacts with the network to identify a discriminative low-dimensional measurement space.

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      • Published in

        cover image ACM Conferences
        GLSVLSI '05: Proceedings of the 15th ACM Great Lakes symposium on VLSI
        April 2005
        518 pages
        ISBN:1595930574
        DOI:10.1145/1057661
        • General Chair:
        • John Lach,
        • Program Chairs:
        • Gang Qu,
        • Yehea Ismail

        Copyright © 2005 ACM

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        Association for Computing Machinery

        New York, NY, United States

        Publication History

        • Published: 17 April 2005

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        Overall Acceptance Rate312of1,156submissions,27%

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