ABSTRACT
Low cost protection of embedded systems against soft errors has recently become a major concern. This issue is even more critical in memory elements that are inherently more prone to transient faults. In this paper, we propose a reliability aware data placement technique in order to partially protect embedded memory systems. We show that by adopting this method instead of traditional placement schemes with complete memory protection, an acceptable level of fault tolerance can be achieved while incurring less area and power overhead. In this approach, each variable in the program is placed in either protected or non-protected memory area according to the profile-driven liveness analysis of all memory variables. In order to measure the level of fault coverage, we inject faults into the memory during the course of program execution in a Monte Carlo simulation framework. Subsequently, we calculate the coverage of partial protection scheme based on the number of protected, failed and crashed runs during the fault injection experiment.
- T. Austin, E. Larson, and D. Ernst. Simplescalar: An infrastructure for computer system modeling. Computer, 35(2):59--67, 2002. Google ScholarDigital Library
- R. Baumann. The impact of technology scaling on soft error rate performance and limits to the efficacy of error correction. In Proc. of the Int'l Digest of Electron Devices Meeting, pages 329--332, 2002.Google ScholarCross Ref
- D. C. Bossen and M. Y. Hsiao. A system solution to the memory soft error problem. IBM Journal of Research and Development, 24(3):390--397, 1980.Google ScholarDigital Library
- B. Calder, C. Krintz, S. John, and T. Austin. Cache-conscious data placement. In Proc. of the eighth international conference on Architectural support for programming languages and operating systems, pages 139--149, 1998. Google ScholarDigital Library
- G. C. Cardarilli, A. Leandri, P. Marinucci, M. Ottavi, S. Pontarelli, M. Re, and A. Salsano. Design of fault tolerant solid state mass memory. IEEE Transactions on Reliability, 52(4):476--491, 2003.Google ScholarCross Ref
- C. L. Chen and M. Y. Hsiao. Error-correcting codes for semiconductor memory applications: A state-of-the-art-review. IBM Journal of Research and Development, 28(2):124--134, 1984.Google ScholarDigital Library
- G. Chen, M. Kandemir, M. J. Irwin, and G. Memik. Compiler-directed selective data protection against soft errors. In ASP-DAC '05: Proceedings of the 2005 conference on Asia South Pacific design automation, pages 713--716, 2005. Google ScholarDigital Library
- K. Constantinides, S. Plaza, J. Blome, B. Zhang, V. Bertacco, S. Mahlke, T. Austin, and M. Orshansky. Assessing SEU vulnerability via circuit-level timing analysis. In Proc. of the 1st Workshop on Architectural Reliability (WAR-1), November 2005.Google Scholar
- N. Derhacobian, V. A. Vardanian, and Y. Zorian. Embedded memory reliability: the SER challenge. In Rec. of Int'l Workshop on Memory Tech., Design and Testing, pages 104--110, 2004. Google ScholarDigital Library
- E. Dupont, M. Nicolaidis, and P. Rohr. Embedded robustness ips for transient-error-free ICs. IEEE Design & Test of Computers, 19(3):54--68, 2002. Google ScholarDigital Library
- S. Ghosh, N. A. Touba, and S. Basu. Reducing power consumption in memory ECC checkers. In Int'l Test Conference, pages 1322--1331, 2004. Google ScholarDigital Library
- M. R. Guthaus, J. S. Ringenberg, D. Ernst, T. M. Austin, T. Mudge, and R. B. Brown. Mibench: A free, commercially representative embedded benchmark suite. In IEEE Int'l Workshop on Workload Characterization(WWC-4), pages 3--14, 2001. Google ScholarDigital Library
- C. Lee, M. Potkonjak, and W. H. Mangione-Smith. Mediabench: a tool for evaluating and synthesizing multimedia and communicatons systems. In MICRO 30: Proceedings of the 30th annual ACM/IEEE international symposium on Microarchitecture, pages 330--335, 1997. Google ScholarDigital Library
- A. M. Saleh, J. J. Serrano, and J. H. Patel. Design of fault tolerant solid state mass memory. IEEE Transactions on Reliability, 39(1):114--122, 1990.Google ScholarCross Ref
- M. L. Seidl and B. G. Zorn. Predicting references to dynamically allocated object. Technical report cu-cs-826-97, department of computer science, university of colorado, boulder, co, January 1997.Google Scholar
- M. L. Seidl and B. G. Zorn. Segregating heap objects by reference behavior and lifetime. In Proc. of the eighth international conference on Architectural support for programming languages and operating systems, pages 12--23, 1998. Google ScholarDigital Library
- S. Shyam, K. Constantinides, S. Phadke, V. Bertacco, and T. Austin. Ultra low-cost defect protection for microprocessor pipelines. In Proc. of the 12th Int'l Conference on Architectural Support for Programming Languages and Operating Systems(ASPLOS'06), October 2006. Google ScholarDigital Library
- F. Vargas and M. Nicolaidis. SEU-tolerant SRAM design based on current monitoring. In Proc. Of 24th Int'l Symposium on Fault-Tolerant Computing, 1994.Google ScholarCross Ref
- J. Yan and W. Zhang. Compiler-guided register reliability improvement against soft errors. In EMSOFT '05: Proceedings of the 5th ACM international conference on Embedded software, pages 203--209, 2005. Google ScholarDigital Library
Index Terms
- Reliability-aware data placement for partial memory protection in embedded processors
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