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- Aging technophiles
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On-chip aging sensor circuits for reliable nanometer MOSFET digital circuits
Accurate performance-degradation monitoring of nanometer MOSFET digital circuits is one of the most critical issues in adaptive design techniques for overcoming the performance degradation due to aging phenomena such as negative bias temperature ...
Impact of adaptive voltage scaling on aging-aware signoff
DATE '13: Proceedings of the Conference on Design, Automation and Test in EuropeTransistor aging due to bias temperature instability (BTI) is a major reliability concern in sub-32nm technology. Aging decreases performance of digital circuits over the entire IC lifetime. To compensate for aging, designs now typically apply adaptive ...
Estimating and Optimizing BTl Aging Effects: From Physics to CAD
2018 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)Transistor aging due to Bias Temperature Instability (BTI) is a crucial degradation that affects the reliability of circuits over time. Aging-aware circuit design flows do virtually not exist yet and even research is in its infancy. In this work, we ...
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