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Automatic generation of test data generators for synchronous programs: Lutess V2

Published:04 September 2007Publication History

ABSTRACT

Lutess is a testing environment designed for synchronous software specified with Lustre, a synchronous data-flow language widely used in safety critical domains such as avionics, energy and transport. Lutess automatically transforms the formal description of the program environment and properties to test generators that feed, on the fly, the program under test. A new version of Lutess has been recently developed, using Constraint Logic Programming. In this version, it is possible to take into account numeric input and output variables and to introduce hypotheses on the program under test. The input language of Lutess has been consequently extended. In this paper we present the new set of operators of the language and illustrate their execution semantics on a simple example.

References

  1. Du Bousquet, L., Ouabdesselam, F., Parissis, I., Richier, J.-L., and Zuanon, N. Lutess : a testing environment for synchronous software. In Tool Support for System Specification, Development and Verification (June 1998), Advances in Computer Science. Springer Verlag, pp. 48--61.Google ScholarGoogle Scholar
  2. Halbwachs, N., Caspi, P., Raymond, P., and Pilaud, D. The synchronous data flow programming language lustre. Proceedings of the IEEE 79, 9 (1991), 1305--1320.Google ScholarGoogle ScholarCross RefCross Ref
  3. Halbwachs, N., Lagnier, F., and Ratel, C. Programming and verifying real-time systems by means of the synchronous data-flow language lustre. IEEE Trans. Software Eng. 18, 9 (1992), 785--793. Google ScholarGoogle ScholarDigital LibraryDigital Library
  4. Jaffar J., L. J.-L. Constraint logic programming. In 14th. ACM Symposium on Principles of Programming Languages (POPL'87) (1987), pp. 111--119. Google ScholarGoogle ScholarDigital LibraryDigital Library
  5. Marre, B., and Arnould, A. Test sequences generation from lustre descriptions: Gatel. In ASE (2000), pp. 229--. Google ScholarGoogle ScholarDigital LibraryDigital Library
  6. Musa, J. Operational Profiles in Software-Reliability Engineering. IEEE Software (1993), 14--32. Google ScholarGoogle ScholarDigital LibraryDigital Library
  7. Pretschner A., Lötzbeyer, H. Model based-testing with constraint logic programming: First results and challenges. In 2nd ICSE Workshop on Automated Program Analysis, Testing and Verification (2001), pp. 1--9. Google ScholarGoogle ScholarDigital LibraryDigital Library
  8. Raymond, P., Nicollin, X., Halbwachs, N., and Weber, D. Automatic testing of reactive systems. In IEEE Real-Time Systems Symposium (1998), pp. 200--209. Google ScholarGoogle ScholarDigital LibraryDigital Library
  9. Seljimi, B., and Parissis, I. Using clp to automatically generate test sequences for synchronous programs with numeric inputs and outputs. In ISSRE (2006), IEEE Computer Society, pp. 105--116. Google ScholarGoogle ScholarDigital LibraryDigital Library

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  1. Automatic generation of test data generators for synchronous programs: Lutess V2

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    • Published in

      cover image ACM Conferences
      DOSTA '07: Workshop on Domain specific approaches to software test automation: in conjunction with the 6th ESEC/FSE joint meeting
      September 2007
      44 pages
      ISBN:9781595937261
      DOI:10.1145/1294921

      Copyright © 2007 ACM

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      Association for Computing Machinery

      New York, NY, United States

      Publication History

      • Published: 4 September 2007

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