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A multi-story power delivery technique for 3D integrated circuits

Published:11 August 2008Publication History

ABSTRACT

Integrating circuits in the vertical direction can alleviate interconnect related problems and enable heterogeneous chips to be stacked in a single package with a small form factor. This paper addresses the power delivery issues in 3D chips revealing some interesting facts and design challenges. A multi-story power delivery technique that can reduce the worst case DC noise by 45% and lower the overhead power consumed in the power supply network by 65% is proposed. A test chip layout in an SOI process, showing a 5.3% area overhead, demonstrates the feasibility of the scheme.

References

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        cover image ACM Conferences
        ISLPED '08: Proceedings of the 2008 international symposium on Low Power Electronics & Design
        August 2008
        396 pages
        ISBN:9781605581095
        DOI:10.1145/1393921

        Copyright © 2008 ACM

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        Publication History

        • Published: 11 August 2008

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