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A defect/error-tolerant nanosystem architecture for DSP

Published:30 November 2009Publication History
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Abstract

Emerging technologies such as silicon NanoWires (NW) and Carbon NanoTubes (CNT) have shown great potential for building the next generation of computing systems in the nano ranges. However, the excessive number of defects originating from bottom-up fabrication (such as a self-assembly process) poses a pressing challenge for achieving scalable system integration. This article proposes a new nanosystem architecture that employs nanowire crossbars for Digital Signal Processing (DSP) applications. Distributed arithmetic is utilized such that complex signal processing computation can be mapped into regular memory operations, thus making this architecture well suited for implementation by nanowire crossbars. Furthermore, the inherent features of DSP-type computation provide new insights to remedy errors (as logic/computational manifestation of defects). A new defect/error-tolerant technique that exploits algorithmic error compensation is proposed; at system level different trade-offs between correctness in output and performance are established while retaining low overhead in its implementation. As an instance of its application, the proposed approach has been utilized to a generic DSP nanosystem performing frequency-selective filtering. Simulation results show that the proposed nanoDSP introduces only a minor performance degradation under high defect rates and at a range of operational conditions. The proposed technique also features good scalability and viability for various DSP applications.

References

  1. DeHon, A. and Wilson, M. J. 2004. Nanowire-Based sublithographic programmable logic arrays. In Proceedings of IEEE International Symponium on Field-Programmable Gate Arrays. 123--132. Google ScholarGoogle ScholarDigital LibraryDigital Library
  2. DeHon, A. 2005. Nanowire-Based programmable architechtures. J. Emerging Technol. Comput. Syst. 1, 109--162. Google ScholarGoogle ScholarDigital LibraryDigital Library
  3. Goldstein, S. C. and Budiu, M. 2001. NanoFabrics: Spatial computing using molecular electronics. In Proceedings of the 28th Annual International Symposium Computer Architecture. 178--189. Google ScholarGoogle ScholarDigital LibraryDigital Library
  4. Han, J. and Jonker, P. 2002. A system architecture solution for unreliable nanoelectronic devices. IEEE Trans. Nanotechnol. 1, 2001--2008. Google ScholarGoogle ScholarDigital LibraryDigital Library
  5. Han, J. and Jonker, P. 2003. A defect- and fault-tolerant architecture for nanocomputers. Nanotechnol. 14. Institute of Physics Publishing, 224--230.Google ScholarGoogle Scholar
  6. Heahth, J. R., Kuekes, P. J., Snider, G. S., and Williams, R. S. 1998. A defect-tolerant computer architecture: Opportunities for nanotechnology. Sci. 280, 1716--1721.Google ScholarGoogle ScholarCross RefCross Ref
  7. Jeffery, C. M. and Figueiredo, R. 2006. Hierarchical fault tolerance for nanoscale memories. IEEE Trans. Nanotechnol. 5, 407--414. Google ScholarGoogle ScholarDigital LibraryDigital Library
  8. Kang, J. and Gaudiot, J. 2006. A simple high-speed multipler design. IEEE Trans. Comput. 55, 1253--1258. Google ScholarGoogle ScholarDigital LibraryDigital Library
  9. Koren, I., Koren, Z., and Stapper, C. H. 1994. A statistical study of defect maps of large area VLSI IC's. IEEE Trans. VLSI Syst. 2, 249--256.Google ScholarGoogle ScholarDigital LibraryDigital Library
  10. Kuekes, P. J., Robinett, W., Seroussi, G., and Williams, R. S. 2005. Defect-Tolerant interconnect to nanoelectronic circuits: Internally redundant demultiplexers based on error-correcting codes. Nanotechnol. 16. Institute of Physics Publishing, 869--882.Google ScholarGoogle Scholar
  11. Lee, Y. T., Park, I. C., and Kyung, C. M. 1993. Design of compact static CMOS carry look-ahead adder using recursive output property. Electron. Lett. 29, 794--795.Google ScholarGoogle ScholarCross RefCross Ref
  12. Lee, M., Kim, H. Y. K., and Choi, Y. H. 2004. A defect-tolerant memory architecture for molecular electronics. IEEE Trans. Nanotechnol. 3, 152--157. Google ScholarGoogle ScholarDigital LibraryDigital Library
  13. Lee, K.-J., Hsieh, T.-Y., and Breuer, M. A. 2005. A novel test methodology based on error-rate to support error-tolerance. In Proceedings of the IEEE International Test Conference. 1136--1144.Google ScholarGoogle Scholar
  14. Ma, C., Strukov, D. B., Lee, J. H., and Likharev, K. K. 2005. Afterline for silicon: CMOL circuit architectures. In Proceedings of IEEE Conference on Nanotechnology. 175--178.Google ScholarGoogle Scholar
  15. Macias, N. J. 1999. The PIG paradigm: The design and use of a massively parallel fine grained self-reconfigurable infinitely scalable architecture. In Proceedings of the 1st NASA/DoD Workshop on Evolvable Hardwares. IEEE Computer Society, 175--180. Google ScholarGoogle ScholarDigital LibraryDigital Library
  16. Macias, N. J. and Anthanas, P. M. 2007. Application of sefl-configurability for autonomous, highly-localized self-regulation. In Proceedings of the 2nd NASA/ESA Conference on Adaptive Hardware and Systems. 397--404. Google ScholarGoogle ScholarDigital LibraryDigital Library
  17. Manger, D., Sipper, M., Stauffer, A., and Tempesti, G. 2000. Toward self-repairing and self-replicating hardware: The embryonics approach. In Proceedings of the 1st NASA/DoD Workshop on Evolvable Hardwares. IEEE Computer Society, 205--214. Google ScholarGoogle ScholarDigital LibraryDigital Library
  18. Mizan, E. 2007. On protecting functional units with temporal redundancy. In Proceedings of the 37th Annual IEEE/IFIP International Conference on Dependable Systems and Networks. 76--77.Google ScholarGoogle Scholar
  19. Naeimi, H. and Dehon, A. 2008. Fault-Tolerant sub-lithographic design with rollback recovery. Nanotechnol. 19. Institute of Physics Publishing, 1--17.Google ScholarGoogle Scholar
  20. Nair, V. S. S. and Abraham, J. A. 1990. Real-Number codes for fault-tolerant matrix operations on processor arrays. IEEE Trans. Comput. 39, 426--435. Google ScholarGoogle ScholarDigital LibraryDigital Library
  21. Parhi, K. K. 1999. VLSI Digital Signal Processing Systems: Design and Implementation. John Wiley&Sons.Google ScholarGoogle Scholar
  22. Peled, A. and Liu, B. 1974. A new hardware realization of digital filters. IEEE Trans. Acoust. Speech, Signal Process. 22, 456--462.Google ScholarGoogle ScholarCross RefCross Ref
  23. Rabaey, J. M., Chandrakasan, A., and Nicolic, B. 2004. Digital Integrated Circuits: A Design Perspective, 2nd ed. Prentice Hall. Google ScholarGoogle ScholarDigital LibraryDigital Library
  24. Rachlin, E. and Savage, J. E. 2008. A framework for coded computation. In Proceedings of the IEEE International Symponium on Information Theory. 2342--2346.Google ScholarGoogle Scholar
  25. Spielman, D. A. 1996. Highly fault-tolerant paralle computation. In Proceedings of 37th Annual IEEE Conference on Foundation of Computer Science. 154--163. Google ScholarGoogle ScholarDigital LibraryDigital Library
  26. Stan, M. R., Franzon, P. D., Goldstein, S. C., Lach, J. C., and Ziegler, M. M. 2003. Molecular electronics: From devices and interconnect to circuits and architecture. Proc. IEEE, 1940--1957.Google ScholarGoogle Scholar
  27. Strukov, D. B. and Likharev, K. K. 2007. Defect-Tolerant architectures for nanoelectronics crossbar memories. J. Nanosci. Nanotechnol. 7, 151--167.Google ScholarGoogle Scholar
  28. Sun, F., Feng, L., and Zhang, T. 2008. Run-Time data-dependent defect tolerance for hybrid CMOS/nanodevice digital memories. IEEE Trans. Nanotechnol. 7, 217--222. Google ScholarGoogle ScholarDigital LibraryDigital Library
  29. Tahoori, M. B. 2005. A mapping algorithm for defect-tolerance of reconfigurable nano-architectures. In Proceedings of the IEEE International Conference on Computer-Aided Design. 668--672. Google ScholarGoogle ScholarDigital LibraryDigital Library
  30. Tang, W. and Wang, L. 2008. A DSP nanosystem with defect tolerance. In Proceedings of the IEEE International Symposium on Nanoscale Architectures. 32--37. Google ScholarGoogle ScholarDigital LibraryDigital Library
  31. von Neumann, J. 1956. Probabilistic logics and the synthesis of reliable organizms from unreliable compnents. In Automata Studies, Princeton University Press, 43--98.Google ScholarGoogle Scholar
  32. Wang, T., Qi, Z., and Moritz, C. A. 2004. Opportunities and challenges in application-tuned circutis and architectures based on nanodevices. In Proceedings of the ACM Conference on Computeirn Frontier. 503--511. Google ScholarGoogle ScholarDigital LibraryDigital Library

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    • Published in

      cover image ACM Journal on Emerging Technologies in Computing Systems
      ACM Journal on Emerging Technologies in Computing Systems  Volume 5, Issue 4
      November 2009
      89 pages
      ISSN:1550-4832
      EISSN:1550-4840
      DOI:10.1145/1629091
      Issue’s Table of Contents

      Copyright © 2009 ACM

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      Publication History

      • Published: 30 November 2009
      • Accepted: 1 June 2009
      • Revised: 1 April 2009
      • Received: 1 January 2009
      Published in jetc Volume 5, Issue 4

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