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Delay and slew metrics using the lognormal distribution

Published:02 June 2003Publication History

ABSTRACT

For optimizations like physical synthesis and static timing analysis, efficient interconnect delay and slew computation is critical. Since one cannot often afford to run AWE[12], constant time solutions are required. This work presents the first complete solution to closed form formulae for both delay and slew. Our metrics are derived from matching circuit moments to the lognormal distribution. From a single table, one can easily implement the metrics for delay and slew for both step and ramp inputs. Experiments validate the effectiveness of the metrics for nets from a real industrial design.

References

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  1. Delay and slew metrics using the lognormal distribution

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    • Published in

      cover image ACM Conferences
      DAC '03: Proceedings of the 40th annual Design Automation Conference
      June 2003
      1014 pages
      ISBN:1581136889
      DOI:10.1145/775832

      Copyright © 2003 ACM

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      New York, NY, United States

      Publication History

      • Published: 2 June 2003

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      DAC '03 Paper Acceptance Rate152of628submissions,24%Overall Acceptance Rate1,770of5,499submissions,32%

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