Layout-Aware Pattern Evaluation and Analysis for Power-Safe Application of Transition Delay Fault Patterns
It is a well known fact that switching activity during test mode is much higher when compared with functional mode. Excessive number of transitions in a circuit causes power supply noise, hot spots and performance degradation which reduce transition delay fault (TDF) test quality and
chip reliability. This paper introduces a layout-aware TDF pattern evaluation procedure integrated into current automatic test pattern generation (ATPG) flow to exclude patterns generating transitions above a certain threshold and to replace them with new patterns meeting the threshold. In
addition, a new design-for-testability (DFT) technique is developed to localize and limit transitions into specific portions of a design layout. The localization grants to control stress on power distribution network of the design. Our comprehensive simulation results over several benchmarks
demonstrate that incorporating the new DFT technique and the pattern evaluation flow can effectively reduce peak switching activity in the design during test. The presented method does not incur area overhead, is independent of patterns, and can be easily integrated into today's physical design
and pattern generation flows.
Keywords: DFT; LAYOUT-AWARE; POWER REDUCTION; TRANSITION DELAY FAULT TESTING
Document Type: Research Article
Publication date: 01 April 2012
- The electronic systems that can operate with very low power are of great technological interest. The growing research activity in the field of low power electronics requires a forum for rapid dissemination of important results: Journal of Low Power Electronics (JOLPE) is that international forum which offers scientists and engineers timely, peer-reviewed research in this field.
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