DFT MAX and Power
As scan compression replaces the traditional scan it is important to understand how it works with power. DFT MAX represents one of the two primary scan compression solutions used in the industry today. The power related technology that is part of DFT MAX is presented in this paper.
Keywords: ADJACENT FILL; CLOCK GATING; IC TESTING; LOW POWER; SCAN COMPRESSION; VOLTAGE ISLANDS
Document Type: Research Article
Publication date: 01 August 2007
- The electronic systems that can operate with very low power are of great technological interest. The growing research activity in the field of low power electronics requires a forum for rapid dissemination of important results: Journal of Low Power Electronics (JOLPE) is that international forum which offers scientists and engineers timely, peer-reviewed research in this field.
- Editorial Board
- Information for Authors
- Subscribe to this Title
- Terms & Conditions
- Ingenta Connect is not responsible for the content or availability of external websites
- Access Key
- Free content
- Partial Free content
- New content
- Open access content
- Partial Open access content
- Subscribed content
- Partial Subscribed content
- Free trial content