Optimal Logic Architecture and Supply Voltage Selection Method to Reduce the Impact of the Threshold Voltage Variation on the Timing
In this paper, we propose a process-variation-resistant logic design method. We show that in the logic circuits working at sub-nominal supply voltage (VDD), proper selection of the logic architecture and VDD together, can reduce the impact of the intra-die and inter-die variability on the timing significantly. First we show that / ratio of the transistor current and delay strongly depends on the VDD. Then, we compare the Process Variation (PV) sensitivity of Low-Power Slow (LP-S) architectures with High-Power Fast (HP-F) ones. The results show that for a given technology, equal power budget, and equal delay, LP-S circuits working at a higher VDD are less PV sensitive compared with HP-F circuits working at a lower VDD. Our method is particularly useful for combating intra-die random variability.
Keywords: DIGITAL VLSL; FLIP-FLOP; LOW-POWER; LOW-VOLTAGE; PROCESS VARIATION; RANDOM VARIATIONS; STATISTICAL VARIABILITY
Document Type: Research Article
Publication date: 01 April 2011
- The electronic systems that can operate with very low power are of great technological interest. The growing research activity in the field of low power electronics requires a forum for rapid dissemination of important results: Journal of Low Power Electronics (JOLPE) is that international forum which offers scientists and engineers timely, peer-reviewed research in this field.
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