Digital Adaptive Calibration of Multi-Step Analog to Digital Converters
This paper reports a novel approach for calibration of multi-step A/D converters based on the steepest-descent estimation method. The calibration procedure is enhanced with dedicated embedded sensors, which register on-chip process parameter and temperature variations. Additionally,
to guide the verification process with the information obtained through process monitoring, two efficient algorithms based on an expectation-maximization method and adjusted support vector machine classifier, respectively, are proposed. The algorithms are evaluated on a prototype 12 bits A/D
converter fabricated in standard single poly, six metal 90 nm CMOS.
Keywords: ANALOG TO DIGITAL CONVERTER; CALIBRATION; DEBUGGING; DIAGNOSIS; PROCESS VARIATION MONITORING
Document Type: Research Article
Publication date: 01 April 2012
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