Selective Algorithms for Built-In Self-Test and Self-Diagnosis in Embedded SRAMS

Memories are one of the most universal cores that are embedded into almost all system on chips (SoCs). Finding cost effective test solution for embedded memories is paramount. Industries are still improving the existing low cost memory test solutions which can support current technologies and advanced SoC architectures. This paper presents a programmable built-in self-diagnosis (PBISD) methodology with self-test for embedded SRAMs. The BISD logic adapts the test controller with micro code encoding technique in order to control the test operation sequences for fault detection. It also encompasses a diagnosis array in order to locate the fault sites. The macro codes are used to select any of seven MARCH algorithms, and detect different faults of the memory under test (MUT). This BISD supports the test, diagnosis and normal operation modes. The experimental results show that this work gives 17–47% improved area overhead and 16–41% enhanced speed compared to three published results.