Abstract
This paper presents opportunities of signal analysis using S-transform. Images of the module and the angle of S-transform show the results. These images may be used as models to compare with unknown signals and to detect patterns and anomalies, even in very sophisticated signals.
Author contributions: All the authors have accepted responsibility for the entire content of this submitted manuscript and approved submission.
Research funding: None declared.
Employment or leadership: None declared.
Honorarium: None declared.
Competing interests: The funding organization(s) played no role in the study design; in the collection, analysis, and interpretation of data; in the writing of the report; or in the decision to submit the report for publication.
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