IEICE Transactions on Electronics
Online ISSN : 1745-1353
Print ISSN : 0916-8524
Regular Section
An Enhanced Well-Changed GGNMOS for 3.3-V ESD Protection in 0.13-µm SOI Process
Mo ZHOUYi SHANYemin DONG
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2020 Volume E103.C Issue 6 Pages 332-334

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Abstract

In this paper, an enhanced well-changed GGNMOS (EW-GGNMOS) is proposed and demonstrated. The new device has the same topology as the conventional 3.3V GGNMOS, except that its well has been changed to the 1.2V p-well. Attributed to higher doping concentration, resulting in a much lower trigger voltage and desirable turn-on uniformity compared to conventional 3.3V GGNMOS. Therefore, we can use EW-GGNMOS as a 3.3V ESD protection device without any additional process.

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© 2020 The Institute of Electronics, Information and Communication Engineers
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