Software-based error detection techniques, which includes error detection mechanism (EDM) transformation, are used for error localization in post-silicon validation. This paper evaluates the performance of EDM for timing error localization with a noise-aware logic simulator and 65-nm test chips assuming the following two EDM usage scenarios; (1) localizing a timing error occurred in the original program, and (2) localizing as many potential timing errors as possible. Simulation results show that the EDM transformation customized for quick error detection cannot locate electrical timing errors in the original program in the first scenario, but it detects 86% of non-masked errors potential bugs in the second scenario, which mean the EDM performance of detecting electrical timing errors affecting execution results is high. Hardware measurement results show that the EDM detects 25% of original timing errors and 56% of non-masked errors. Here, these hardware measurement results are not consistent with the simulation results. To investigate the reason, we focus on the following two differences between hardware and simulation; (1) design of power distribution network, and (2) definition of timing error occurrence frequency. We update the simulation setup for filling the difference and re-execute the simulation. We confirm that the simulation and the chip measurement results are consistent.