2018 Volume E101.C Issue 1 Pages 78-81
This paper discusses design challenges and possible solutions for 3D NAND. A 3D NAND array inherently has a larger parasitic capacitance and thereby critical area in terms of product yield. To mitigate such issues associated with 3D NAND technology, array control and divided array architecture for improving reliability and yield and for reducing area overhead, program time, energy per bit and array noise are proposed.