Regular Section
A Low Power Test Pattern Generator for BIST
2010 Volume E93.C Issue 5 Pages 696-702
Details
2010 Volume E93.C Issue 5 Pages 696-702
To tackle the increasing testing power during built-in self-test (BIST) operations, this paper proposes a new test pattern generator (TPG). With the proposed reconfigurable LFSR, the reconfigurable Johnson counter, the decompressor and the XOR gate network, the introduced TPG can produce the single input change (SIC) sequences with few repeated vectors. The proposed SIC sequences minimize switching activities of the circuit under test (CUT). Simulation results on ISCAS benchmarks demonstrate that the proposed method can effectively save test power, and does not impose high impact on test length and hardware for the scan based design.
