Probing of Electric Field Distribution in ITO/PI/P3HT/Au Using Electric Field Induced Second Harmonic Generation

Ryo MIYAZAWA; Dai TAGUCHI; Takaaki MANAKA; Mitsumasa IWAMOTO

doi:10.1587/transele.E94.C.185

Special Section on Recent Progress in Molecular and Organic Devices

Probing of Electric Field Distribution in ITO/PI/P3HT/Au Using Electric Field Induced Second Harmonic Generation

Ryo MIYAZAWA ^†, Dai TAGUCHI ^†, Takaaki MANAKA ^†, Mitsumasa IWAMOTO ^†

Author information

Keywords: electron trap, SHG, MIS, P3HT, C-V

JOURNAL RESTRICTED ACCESS

2011 Volume E94.C Issue 2 Pages 185-186

DOI https://doi.org/10.1587/transele.E94.C.185

Details

Abstract

By using electric field induced second harmonic generation (EFISHG) and Capacitance-Voltage (C-V) measurements, we studied carrier behaviors in ITO/polyimide (PI)/poly (3-hexylthiophene)(P3HT)/Au diodes. Photoillumination caused the threshold voltage shift in the C-V, and agreed well with the shift probed by the EFISHG. Results suggested trapped electrons were accumulated in the PI layer.

Corresponding author

Register with J-STAGE for free!