IEICE Transactions on Electronics
Online ISSN : 1745-1353
Print ISSN : 0916-8524
Regular Section
Evaluation of L-2L De-Embedding Method Considering Misalignment of Contact Position for Millimeter-Wave CMOS Circuit Design
Qinghong BUNing LIKenichi OKADAAkira MATSUZAWA
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2012 Volume E95.C Issue 5 Pages 942-948

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Abstract

This paper presents the evaluation of the L-2L de-embedding method with misalignment of the contact position. The issues of misalignment of the contact position are investigated. The analysis of misalignment in the L-2L de-embedding procedure is performed. Two comparisons are carried out to verify the error of the L-2L de-embedding method. The calculation percent error in quality factor of the transmission line becomes up to 9.0%, while the transistor S-parameter error percentage becomes up to 21% at 60GHz in the experimental results. The results show that the measurement errors, caused by the misalignment of the contact position, should be considered carefully.

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© 2012 The Institute of Electronics, Information and Communication Engineers
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