Regular Section
A Novel Pattern Run-Length Coding Method for Test Data Compression
2013 Volume E96.C Issue 9 Pages 1201-1204
Details
2013 Volume E96.C Issue 9 Pages 1201-1204
This paper presents a novel data compression method for testing integrated circuits within the framework of pattern run-length coding. The test set is firstly divided into 2n-length patterns where n is a natural number. Then the compatibility of each pattern, which can be an external type, or an internal type, is analyzed. At last, the codeword of each pattern is generated according to its analysis result. Experimental results for large ISCAS89 benchmarks show that the proposed method can obtain a higher compression ratio than existing ones.
