IEICE Transactions on Electronics
Online ISSN : 1745-1353
Print ISSN : 0916-8524
Regular Section
Built-In Self-Test for Static ADC Testing with a Triangle-Wave
Incheol KIMIngeol LEESungho KANG
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2013 Volume E96.C Issue 2 Pages 292-294

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Abstract

This paper proposes a new BIST (Built-In Self-Test) method for static testing of an ADC (Analog-to-Digital Converter) with transition detection method. The proposed BIST uses a triangle-wave as an input test stimulus and calculates the ADC's static parameters. Simulation results show that the proposed BIST can test both rising and falling transitions with minimal hardware overhead.

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© 2013 The Institute of Electronics, Information and Communication Engineers
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