VLSIs that perform signal processing near infrared sensors cooled to ultra-low temperature are demanded. Delay test of those chips must be executed at ultra-low temperature while functional test could be performed at room temperature as long as hold timing errors do not occur. In this letter, we focus on the hold timing violation and evaluate the feasibility of functional test of ultra-low temperature circuits at room temperature. Experimental evaluation with a case study shows that the functional test at room temperature is possible.