IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
Online ISSN : 1745-1337
Print ISSN : 0916-8508
Special Section on Image Media Quality
Face Alignment Based on Statistical Models Using SIFT Descriptors
Zisheng LIJun-ichi IMAIMasahide KANEKO
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2009 Volume E92.A Issue 12 Pages 3336-3343

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Abstract

Active Shape Model (ASM) is a powerful statistical tool for image interpretation, especially in face alignment. In the standard ASM, local appearances are described by intensity profiles, and the model parameter estimation is based on the assumption that the profiles follow a Gaussian distribution. It suffers from variations of poses, illumination, expressions and obstacles. In this paper, an improved ASM framework, GentleBoost based SIFT-ASM is proposed. Local appearances of landmarks are originally represented by SIFT (Scale-Invariant Feature Transform) descriptors, which are gradient orientation histograms based representations of image neighborhood. They can provide more robust and accurate guidance for search than grey-level profiles. Moreover, GentleBoost classifiers are applied to model and search the SIFT features instead of the unnecessary assumption of Gaussian distribution. Experimental results show that SIFT-ASM significantly outperforms the original ASM in aligning and localizing facial features.

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© 2009 The Institute of Electronics, Information and Communication Engineers
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