IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
Online ISSN : 1745-1337
Print ISSN : 0916-8508
Regular Section
A Randomness Test Based on T-Complexity
Kenji HAMANOHirosuke YAMAMOTO
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2010 Volume E93.A Issue 7 Pages 1346-1354

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Abstract

We propose a randomness test based on the T-complexity of a sequence, which can be calculated using a parsing algorithm called T-decomposition. Recently, the Lempel-Ziv (LZ) randomness test based on LZ-complexity using the LZ78 incremental parsing was officially excluded from the NIST test suite in NIST SP 800-22. This is caused from the problem that the distribution of P-values for random sequences of length 106 is strictly discrete for the LZ-complexity. Our proposed test can overcome this problem because T-complexity has almost ideal continuous distribution of P-values for random sequences of length 106. We also devise a new sequential T-decomposition algorithm using forward parsing, while the original T-decomposition is an off-line algorithm using backward parsing. Our proposed test can become a supplement to NIST SP 800-22 because it can detect several undesirable pseudo-random numbers that the NIST test suite almost fails to detect.

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© 2010 The Institute of Electronics, Information and Communication Engineers
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