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Wheat ear growth modeling based on a polygon

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Abstract

Visual inspection of wheat growth has been a useful tool for understanding and implementing agricultural techniques and a way to accurately predict the growth status of wheat yields for economists and policy decision makers. In this paper, we present a polygonal approach for modeling the growth process of wheat ears. The grain, lemma, and palea of wheat ears are represented as editable polygonal models, which can be re-polygonized to detect collision during the growth process. We then rotate and move the colliding grain to resolve the collision problem. A linear interpolation and a spherical interpolation are developed to simulate the growth of wheat grain, performed in the process of heading and growth of wheat grain. Experimental results show that the method has a good modeling effect and can realize the modeling of wheat ears at different growth stages.

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Correspondence to Ming-liang Xu.

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Jun-xiao XUE, Chen-yang SUN, Jun-jin CHENG, Ming-liang XU, Ya-fei LI, and Shui YU declare that they have no conflict of interest.

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Project supported by the National Natural Science Foundation of China (Nos. 61772474, 61872324, and 61822701), the Natural Science Foundation of Henan Province of China (No. 162300410262), and the Key Research Projects of Henan Higher Education Institutions of China (No. 18A413002)

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Xue, Jx., Sun, Cy., Cheng, Jj. et al. Wheat ear growth modeling based on a polygon. Frontiers Inf Technol Electronic Eng 20, 1175–1184 (2019). https://doi.org/10.1631/FITEE.1800702

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  • DOI: https://doi.org/10.1631/FITEE.1800702

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