Abstract:
In this paper, the sample deformation caused by the probe-sample interaction during atomic force microscopy (AFM) contact mode (CM) imaging of live cells is analyzed and ...Show MoreMetadata
Abstract:
In this paper, the sample deformation caused by the probe-sample interaction during atomic force microscopy (AFM) contact mode (CM) imaging of live cells is analyzed and quantified. CM is the most commonly used imaging approach for live cell topography characterization. However, due to the intrinsic softness of live cell membrane, the sample deformation caused by the probe-sample interaction leads to significant error in the topography quantified in CM imaging. Although it has been recommended to keep the sample deformation small by using low imaging speed (scan rate <; 0.2 Hz), such an approach is not only time consuming, but also incapable of providing accurate topography characterization. The proposed work aims to quantify the sample deformation in CM imaging by using an energy-based approach to formulate the lateral imaging force exerted from AFM probe to the sample. To validate the proposed deformation quantification approach, the deformation difference of live human prostate cancer cells caused by two different CM imaging speeds (0.1 Hz vs. 0.5 Hz) was quantified using the proposed model and compared to that measured experimentally. The comparison showed that the sample deformation difference obtained from the proposed model was more that 70% close to the experimental data (the percentage was the RMS value of the point-by-point difference over the entire imaging area).
Published in: 2017 American Control Conference (ACC)
Date of Conference: 24-26 May 2017
Date Added to IEEE Xplore: 03 July 2017
ISBN Information:
Electronic ISSN: 2378-5861