Quantitative Viscoelasticity Studies with Atomic Force Microscopy | IEEE Conference Publication | IEEE Xplore

Quantitative Viscoelasticity Studies with Atomic Force Microscopy


Abstract:

Linear theory of viscoelasticity has many parallels with LTI control systems, and identification methods for LTI can be applied to study viscoelastic materials. However, ...Show More

Abstract:

Linear theory of viscoelasticity has many parallels with LTI control systems, and identification methods for LTI can be applied to study viscoelastic materials. However, conducting such a study with atomic force microscopy (AFM) requires overcoming many challenges, including: (a) accurate piezo control of the tip trajectory; (b) calibration of the probe (spring constant and tip shape) and opto-mechanical system (inverse optical sensitivity); (c) converting z-position to indentation depth and limit error propagation of the conversion; (d) identification of the point of contact. Accounting for the tip shape also makes the viscoelastic models nonlinear. We describe the development of an AFM experiment and analysis that overcomes these challenges and demonstrate practical viscoelastic measurements at the nanometer scale.
Date of Conference: 27-29 June 2018
Date Added to IEEE Xplore: 16 August 2018
ISBN Information:
Electronic ISSN: 2378-5861
Conference Location: Milwaukee, WI, USA

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