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Multiple fault isolation in diagnostics of industrial processes | IEEE Conference Publication | IEEE Xplore

Multiple fault isolation in diagnostics of industrial processes


Abstract:

The paper concerns the problems of on-line diagnosis of industrial processes with multiple faults. The authors discussed some hypotheses of multiple faults isolation cond...Show More

Abstract:

The paper concerns the problems of on-line diagnosis of industrial processes with multiple faults. The authors discussed some hypotheses of multiple faults isolation conditions. Particularly, the multiple fault isolation analysis under assumption of single faults hypothesis is discussed. The simple, practical algorithm of multiple fault isolation was given.
Date of Conference: 01-04 September 2003
Date Added to IEEE Xplore: 23 April 2015
Print ISBN:978-3-9524173-7-9
Conference Location: Cambridge, UK

References

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