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A Demultiplexer Immune from Fabrication-Error Impairments as an Enabler of Compact High-Channel-Count (> 64 ch) Dense WDM Systems on Low-End Si PIC Platforms | IEEE Conference Publication | IEEE Xplore

A Demultiplexer Immune from Fabrication-Error Impairments as an Enabler of Compact High-Channel-Count (> 64 ch) Dense WDM Systems on Low-End Si PIC Platforms


Abstract:

We propose and theoretically validate a novel demultiplexer capable to automatically correct all fabrication-error-induced spectrum impairments. This technology, once rea...Show More

Abstract:

We propose and theoretically validate a novel demultiplexer capable to automatically correct all fabrication-error-induced spectrum impairments. This technology, once realized, enables high-channel-count (> 64 ch) dense WDM systems on low-end Si PIC platforms.
Date of Conference: 07-11 July 2019
Date Added to IEEE Xplore: 29 August 2019
ISBN Information:
Conference Location: Fukuoka, Japan

References

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