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Experimental Evaluation of Wavelength-Dependence of Thin-Film LiNbO3 Modulator with an Extinction-Ratio-Tunable Structure | IEEE Conference Publication | IEEE Xplore

Experimental Evaluation of Wavelength-Dependence of Thin-Film LiNbO3 Modulator with an Extinction-Ratio-Tunable Structure


Abstract:

We investigate the operation of a thin-film lithium niobite modulator with specific focus on the wavelength dependence. For a precise evaluation of the modulation distort...Show More

Abstract:

We investigate the operation of a thin-film lithium niobite modulator with specific focus on the wavelength dependence. For a precise evaluation of the modulation distortion, we used an extinction-ratio-tunable-type modulator.
Date of Conference: 07-11 July 2019
Date Added to IEEE Xplore: 29 August 2019
ISBN Information:
Conference Location: Fukuoka, Japan

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