Abstract:
This paper reports state-of-the-art values for a 200mm LPCVD silicon nitride platform in terms of layer thickness control; 1nm for a silicon nitride thickness of 400nm wi...Show MoreMetadata
Abstract:
This paper reports state-of-the-art values for a 200mm LPCVD silicon nitride platform in terms of layer thickness control; 1nm for a silicon nitride thickness of 400nm with low propagation loss 0.13dB/cm at 1520nm.
Date of Conference: 07-11 July 2019
Date Added to IEEE Xplore: 29 August 2019
ISBN Information: