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Ultra-Sharp Single-Crystal Nano Fiber Probes | IEEE Conference Publication | IEEE Xplore

Ultra-Sharp Single-Crystal Nano Fiber Probes


Abstract:

We present how an effective fiber drawing process followed by low-cost and controllable etching enables atomically smooth YAG crystal fiber, producing high-crystallinity,...Show More

Abstract:

We present how an effective fiber drawing process followed by low-cost and controllable etching enables atomically smooth YAG crystal fiber, producing high-crystallinity, defect-free, and ultra-sharp tapered probes with apexes down to 1.5 nm.
Date of Conference: 07-11 July 2019
Date Added to IEEE Xplore: 29 August 2019
ISBN Information:
Conference Location: Fukuoka, Japan

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