A 10.0 ENOB, 6.2 fJ/conv.-step, 500 MS/s Ringamp-Based Pipelined-SAR ADC with Background Calibration and Dynamic Reference Regulation in 16nm CMOS | IEEE Conference Publication | IEEE Xplore

A 10.0 ENOB, 6.2 fJ/conv.-step, 500 MS/s Ringamp-Based Pipelined-SAR ADC with Background Calibration and Dynamic Reference Regulation in 16nm CMOS


Abstract:

We present a single-channel fully-dynamic pipelined SAR ADC that leverages a novel quantizer and narrowband dither injection to achieve fast and comprehensive background ...Show More

Abstract:

We present a single-channel fully-dynamic pipelined SAR ADC that leverages a novel quantizer and narrowband dither injection to achieve fast and comprehensive background calibration of DAC mismatch, interstage gain, and ring amplifier (ringamp) bias optimality. The ADC also includes an on-chip wide-range, fully-dynamic reference regulation system. Consuming 3.3 mW at 500 MS/s, it achieves 10.0 ENOB and 75.5 dB SFDR, yielding a Walden FoM of 6.2 fJ/c.s.
Date of Conference: 13-19 June 2021
Date Added to IEEE Xplore: 28 July 2021
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Conference Location: Kyoto, Japan

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