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Experimental Demonstration of Probabilistic-Bit (p-bit) Utilizing Stochastic Oscillation of Threshold Switch Device | IEEE Conference Publication | IEEE Xplore

Experimental Demonstration of Probabilistic-Bit (p-bit) Utilizing Stochastic Oscillation of Threshold Switch Device


Abstract:

To realize p-bits that fluctuate between 0 and 1 with precisely controlled probabilities, stochastic oscillation behavior of threshold switch (TS) device was induced by a...Show More

Abstract:

To realize p-bits that fluctuate between 0 and 1 with precisely controlled probabilities, stochastic oscillation behavior of threshold switch (TS) device was induced by applying supply voltage (\mathrm{V}_{\mathrm{D}\mathrm{D}}) near-threshold voltage (\mathrm{V}_{\mathrm{T}\mathrm{H}}). Insulator-metal transition (IMT) device and ovonic threshold switch (OTS) device were investigated as a source of p-bit generation. It was confirmed that a small voltage change of mV-scale in the near-threshold region can give a high degree of stochasticity to the oscillation frequency. Also, the probability was controlled by a comparator and shift of a compare-voltage (\mathrm{V}_{\mathrm{comp}}) with excellent controllability. Finally, a simple probabilistic Boolean logic operation was tested by 100 p-bits generated from IMT devices.
Date of Conference: 11-16 June 2023
Date Added to IEEE Xplore: 24 July 2023
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Conference Location: Kyoto, Japan

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