Theory of the in-circuit observation of VLSICs using autocorrelation functions

Abstract

A method of formation of an autocorrelation function (ACF) as applied to the problem of observation of interior points of processor VLSICs is considered. As elementary events for the synthesis of empirical ACF values, the antecedently determined vectors z _ξ,t = x _η,t ∪ x _ω,t and y _{λ,t + τ} are used; the setting for them is performed by an integrated circuit control automat. It is shown that the principle of statistical control using ACF in asymptotics is more definite than linear signature analysis or condition vector counting.