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Energy Spectrum of Stochastic Signals Caused by Variations of Electrical Resistance

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Abstract

The purpose of the study was to investigate the energy spectrum of stochastic signals caused by the fluctuations of electric resistance of the resistance coils, the metal film resistors and the encephalograms of patients. We have established that all energy spectra of the investigated stochastic signals contain a flicker component that in case of the metal film resistors depends on the defects of their inner structure. We have suggested the reason for the appearance of spectrum flicker-component in the energy spectrum of the stochastic signals of systems of different origin. This reason is the nonequilibrium state of the investigated system. We have shown that it is possible to calculate the flicker noise of the investigated system on any frequencies as well as the flicker noise power, using only two parameters: the value of energy spectrum on the middle and high frequencies (energy spectrum of the equilibrium system) and the relaxation time.

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References

  1. Theodorou, C.G., Fasarakis, N., Hoffman, T., Chiarella, T., Ghibaudo, G., and Dimitriadis, C.A., Origin of the low-frequency noise in n-channel FinFETs, Solid-State Electron., 2013, vol. 82, pp. 21–24.

    Article  Google Scholar 

  2. Hossain, M.Z., Rumyantsev, S., Shur, M.S., and Balandin, A.A., Reduction of 1/f noise in graphene after electron-beam irradiation, Appl. Phys. Lett., 2013, vol. 102, no. 15.

    Google Scholar 

  3. Shmelev, E., Klyuev, A., and Yakimov, A., Complexes of spatially multistable defects as the source of 1/f noise in devices, Fluctuation Noise Lett., 2013, vol. 12, no. 1, p. 13.

    Article  Google Scholar 

  4. Sergeev, E., Knapek, A., Grmela, L., and Šikula, J., Noise diagnostic method of experimental cold field-emission cathodes, 22nd International Conference on Noise Fluctuations, 2013, p. 38.

    Book  Google Scholar 

  5. Guillet, B., Wu, S., Mechin, L., Adamo, C., Schlom, D.G., and Routoure, J.M., Correlation of 1/f noise with DC electrical properties in La0.7Sr0.3MnO3 thin films, 22nd International Conference on Noise Fluctuations, 2013, p. 43.

    Google Scholar 

  6. Leroy, G., Yang, L., Gest, J., and Vandamme, L.K.J., Research on the properties of ZnO films by 1/f noise measurement, 22nd International Conference on Noise Fluctuations, 2013, p. 48.

    Google Scholar 

  7. Wagner, P.-J., Aichinger, T., Grasser, T., Nelhiebel, M., and Vandamme, L.K.J., Possible correlation between flicker noise and bias temperature stress. Noise and fluctuations, 20 International Conference (ICNF 2009), 2009, pp. 621–624.

    Google Scholar 

  8. Levinzon, F.A. and Vandamme, L.K.J., Comparison of 1/f noise in jfets and mosfets with several figures of merit, Fluctuation Noise Lett., 2011, vol. 10, no. 4, pp. 447–465.

    Article  Google Scholar 

  9. Qinghui, S., Guanxiong, L., Teweldebrhan, D., Balandin, A.A., Rumyantsev, S., Shur, M.S., and Dong, Y., Flicker noise in bilayer graphene transistors, Electron Device Lett., 2009, vol. 30, no. 3, pp. 288–290.

    Article  Google Scholar 

  10. Kobayashi, T.J., Bayesian information processing in stochastic biological systems, 22nd International Conference on Noise Fluctuations, 2013, pp. 137.

    Google Scholar 

  11. Meddah, A. and Kadri, T., Stochastic behavior of a bridge under moving vehicles with irregular deck, 22nd International Conference on Noise Fluctuations, 2013, p. 13.

    Google Scholar 

  12. Varotsos, C., Melnikova, I., Efstathiou, M., and Tzanis, C., 1/f noise in the UV solar spectral irradiance, Theor. Appl. Climatol., 2013, vol. 111, nos. 3–4, pp. 641–648.

    Article  Google Scholar 

  13. Aliev, F.G., Cascales, J.P., Bonell, F., and Andrieu, S., Band edge noise spectroscopy, 22nd International Conference on Noise Fluctuations, 2013, p. 66.

    Google Scholar 

  14. Fink, T. and Bluhm, H., Noise spectroscopy using correlations of single-shot qubit readout, Phys. Rev. Lett., 2013, vol. 110, no. 1.

    Google Scholar 

  15. Vandamme, L.K.J., How useful is Hooge’s empirical relation?, 22nd International Conference on Noise Fluctuations, 2013, p. 17.

    Google Scholar 

  16. Litak, G., Polyakov, Y.S., Timashev, S.F., and Rusinek, R., Dynamics of stainless steel turning: Analysis by flicker-noise spectroscopy, Phys. A: Stat. Mech. Its Appl., 2013, vol. 392, no. 23, pp. 6052–6063.

    Article  Google Scholar 

  17. Zhigal’skii, G.P., Nonequilibrium 1/fγ noise in conducting films and contacts, Phys. Usp., 2003, vol. 46, no. 5, pp. 449–471.

    Article  Google Scholar 

  18. Kolodiy, Z.A. and Kolodiy, A.Z., Calculation of the noise level in electronic elements, Autom. Control Comput. Sci., 2009, vol. 43, no. 4, pp. 179–183.

    Article  Google Scholar 

  19. Kolodiy, Z.A. and Mandziy, B.A., Calculation of flicker noise power, Autom. Control Comput. Sci., 2016, vol. 50, no. 1, pp. 15–19.

    Article  Google Scholar 

  20. Kolodiy, Z.A., Detection of changes in the structure of a system according to changes of its flicker noise, Ukr. J. Phys., 2008, vol. 53, no. 7, pp. 718–722.

    Google Scholar 

  21. Kolodiy, Z. and Kolodiy, A., Fluctuations of flicker type in technical and natural systems, 22nd International Conference on Noise Fluctuations, 2013, p. 131.

    Book  Google Scholar 

  22. Broniec, A., Analysis of EEG signal by flicker-noise spectroscopy: Identification of right-/left-hand movement imagination, Med. Biol. Eng. Comput., 2016, vol. 54, no. 12, pp. 1935–1947.

    Article  Google Scholar 

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Kolodiy, Z.A., Stadnyk, B.I., Yatsyshyn, S.P. et al. Energy Spectrum of Stochastic Signals Caused by Variations of Electrical Resistance. Aut. Control Comp. Sci. 52, 311–316 (2018). https://doi.org/10.3103/S0146411618040065

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  • DOI: https://doi.org/10.3103/S0146411618040065

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