A Highly Reliable Storage Systems Based on SSD Array for IoE Environment

A Highly Reliable Storage Systems Based on SSD Array for IoE Environment

HooYoung Ahn, Junsu Kim, YoonJoon Lee
Copyright: © 2017 |Volume: 9 |Issue: 4 |Pages: 15
ISSN: 1938-0259|EISSN: 1938-0267|EISBN13: 9781522512066|DOI: 10.4018/IJGHPC.2017100101
Cite Article Cite Article

MLA

Ahn, HooYoung, et al. "A Highly Reliable Storage Systems Based on SSD Array for IoE Environment." IJGHPC vol.9, no.4 2017: pp.1-15. http://doi.org/10.4018/IJGHPC.2017100101

APA

Ahn, H., Kim, J., & Lee, Y. (2017). A Highly Reliable Storage Systems Based on SSD Array for IoE Environment. International Journal of Grid and High Performance Computing (IJGHPC), 9(4), 1-15. http://doi.org/10.4018/IJGHPC.2017100101

Chicago

Ahn, HooYoung, Junsu Kim, and YoonJoon Lee. "A Highly Reliable Storage Systems Based on SSD Array for IoE Environment," International Journal of Grid and High Performance Computing (IJGHPC) 9, no.4: 1-15. http://doi.org/10.4018/IJGHPC.2017100101

Export Reference

Mendeley
Favorite Full-Issue Download

Abstract

Devices in IoE (Internet of Everything) environment generate massive data from various sensors. To store and process the rapidly incoming large-scale data, SSDs are used for improving performance and reliability of storage systems. However, they have typical problem called write amplification which is caused by out-of-place updates characteristics. As the write amplification increases, it degrades I/O performance and shortens SSDs' lifetime. This paper presents a new approach to reduce write amplification of SSD arrays. To solve the problem, this paper proposes a new parity update scheme, called LPUS. LPUS transforms random parity updates to sequential writes with additional log blocks in SSD arrays by using parity logs and lazy parity updates. The experimental results show that, LPUS reduces write amplification up to 37% and the number of erases up to 50% with the reasonable size of log space.

Request Access

You do not own this content. Please login to recommend this title to your institution's librarian or purchase it from the IGI Global bookstore.