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A Neuromorphic Single-Electron Circuit for Noise-Shaping Pulse-Density Modulation

A Neuromorphic Single-Electron Circuit for Noise-Shaping Pulse-Density Modulation

Andrew Kilinga Kikombo, Tetsuya Asai, Takahide Oya, Alexandre Schmid, Yusuf Leblebici
Copyright: © 2009 |Volume: 1 |Issue: 2 |Pages: 13
ISSN: 1941-6318|EISSN: 1941-6326|ISSN: 1941-6318|EISBN13: 9781615204151|EISSN: 1941-6326|DOI: 10.4018/jnmc.2009040106
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MLA

Kikombo, Andrew Kilinga, et al. "A Neuromorphic Single-Electron Circuit for Noise-Shaping Pulse-Density Modulation." IJNMC vol.1, no.2 2009: pp.80-92. http://doi.org/10.4018/jnmc.2009040106

APA

Kikombo, A. K., Asai, T., Oya, T., Schmid, A., & Leblebici, Y. (2009). A Neuromorphic Single-Electron Circuit for Noise-Shaping Pulse-Density Modulation. International Journal of Nanotechnology and Molecular Computation (IJNMC), 1(2), 80-92. http://doi.org/10.4018/jnmc.2009040106

Chicago

Kikombo, Andrew Kilinga, et al. "A Neuromorphic Single-Electron Circuit for Noise-Shaping Pulse-Density Modulation," International Journal of Nanotechnology and Molecular Computation (IJNMC) 1, no.2: 80-92. http://doi.org/10.4018/jnmc.2009040106

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Abstract

We propose a bio-inspired circuit performing pulse-density modulation with single-electron devices. The proposed circuit consists of three single-electron neuronal units, receiving the same input and are connected to a common output. The output is inhibitorily fedback to the three neuronal circuits through a capacitive coupling. The circuit performance was evaluated through Monte-Carlo based computer simulations. We demonstrated that the proposed circuit possesses noise-shaping characteristics, where signal and noises are separated into low and high frequency bands respectively. This significantly improved the signal-tonoise ratio (SNR) by 4.34 dB in the coupled network, as compared to the uncoupled one. The noise-shaping properties are as a result of i) the inhibitory feedback between the output and the neuronal circuits, and ii) static noises (originating from device fabrication mismatches) and dynamic noises (as a result of thermally induced random tunneling events) introduced into the network.

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