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Application Profiles and Tailor-Made Conformance Test Systems

Application Profiles and Tailor-Made Conformance Test Systems

Ingo Dahn, Sascha Zimmermann
Copyright: © 2010 |Volume: 8 |Issue: 2 |Pages: 14
ISSN: 1539-3062|EISSN: 1539-3054|EISBN13: 9781609609092|DOI: 10.4018/jitsr.2010070105
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MLA

Dahn, Ingo, and Sascha Zimmermann. "Application Profiles and Tailor-Made Conformance Test Systems." IJITSR vol.8, no.2 2010: pp.60-73. http://doi.org/10.4018/jitsr.2010070105

APA

Dahn, I. & Zimmermann, S. (2010). Application Profiles and Tailor-Made Conformance Test Systems. International Journal of IT Standards and Standardization Research (IJITSR), 8(2), 60-73. http://doi.org/10.4018/jitsr.2010070105

Chicago

Dahn, Ingo, and Sascha Zimmermann. "Application Profiles and Tailor-Made Conformance Test Systems," International Journal of IT Standards and Standardization Research (IJITSR) 8, no.2: 60-73. http://doi.org/10.4018/jitsr.2010070105

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Abstract

This article examines the potential of application profiles and domain profiles as means to adapt technical specifications of data structures to particular needs. The authors argue that application profiling is better suited to increase the use of formal specifications than the creation of new specifications. The authors also describe a method to generate specific conformance test systems for machine-readable application profiles. The authors describe the respective tool set of the SchemaProf Application Profiling Tool and the Generic Test System and report on the experience of their usage in developing and introducing the IMS Common Cartridge domain profile.

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