Authors:
Yu Wang
1
;
Chenbo Shi
2
;
Chun Zhang
2
and
Qingmin Liao
1
Affiliations:
1
Tsinghua University, Shenzhen Key Lab. of Information Sci&Tech and Shenzhen Engineering Lab. of IS&DRM, China
;
2
Tsinghua University, China
Keyword(s):
Computer Vision, Biscuit Inspection, Real-time, Unfolding Image, Feature Extraction, Polarized Image.
Related
Ontology
Subjects/Areas/Topics:
Color and Texture Analyses
;
Computer Vision, Visualization and Computer Graphics
;
Features Extraction
;
Image and Video Analysis
Abstract:
This paper presents a computer vision system for biscuit defects inspection which contains both hardware
and software. By utilizing the system with two cameras, we focus on the detection of biscuit partial deletion
and cream overflow. For detecting partial deletion, a new algorithm with a membership function for
calculating feature descriptor is proposed. It’s convenient and efficient to extract feature of textons. For
cream overflow detection, a chemical property of enantiomers under polarized light is made use of
distinguishing cream from background. The proposed system has been implemented on the production line.
Groups of on-line experiments show that our system can achieve accurate defect detection with low missing
detection rate and false alarm.