Authors:
Oliver Rippel
1
;
Maximilian Müller
1
;
Andreas Münkel
2
;
Thomas Gries
2
and
Dorit Merhof
1
Affiliations:
1
Institute of Imaging & Computer Vision, RWTH Aachen University, Aachen, Germany
;
2
Institut für Textiltechnik, RWTH Aachen University, Aachen, Germany
Keyword(s):
Anomaly Detection, Quality Control, Fabric Inspection, Transfer Learning, Probability Density Estimation.
Abstract:
Image-based quality control aims at detecting anomalies (i.e. defects) in products. Supervised, data driven approaches have greatly improved Anomaly Detection (AD) performance, but suffer from a major drawback: they require large amounts of annotated training data, limiting their economic viability. In this work, we challenge and overcome this limitation for complex patterned fabrics. Investigating the structure of deep feature representations learned on a large-scale fabric dataset, we find that fabrics form clusters according to their fabric type, whereas anomalies form a cluster on their own. We leverage this clustering behavior to estimate the Probability Density Function (PDF) of new, previously unseen fabrics, in the deep feature representations directly. Using this approach, we outperform supervised and semi-supervised AD approaches trained on new fabrics, requiring only defect-free data for PDF-estimation.